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Metrology Developments for Future Wireless Technologies Episode from the podcast Metrology Developments for Future Wireless Technologies
Two-Tone and Multi-Sine Characterization of Non Linear Dynamic Microwave Devices and Systems

Two-Tone and Multi-Sine Characterization of Non Linear Dynamic Microwave Devices and Systems

Released Friday, 9th November 2012
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Two-Tone and Multi-Sine Characterization of Non Linear Dynamic Microwave Devices and Systems

Two-Tone and Multi-Sine Characterization of Non Linear Dynamic Microwave Devices and Systems

Two-Tone and Multi-Sine Characterization of Non Linear Dynamic Microwave Devices and Systems

Two-Tone and Multi-Sine Characterization of Non Linear Dynamic Microwave Devices and Systems

Friday, 9th November 2012
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Las tecnologías inalámbricas emergentes han tenido un gran impacto en las actuales técnicas de caracterización experimental en la banda de las microondas. El cambio de paradigma, desde lo analógico a lo digital y desde RF a DC, tiene un gran impacto en la forma en la que se ve hoy en día la caracterización no lineal de microondas. En esta charla se presentará una visión general de estas tecnologías, centrándose en Software Defined Radio y en conversores de RF a DC para la transmisión inalámbrica de potencia y, a pesar de sus aparentes diferencias, la caracterización no lineal será presentada como una visión integrada sobre la forma de modelar y de caracterizar esos componentes.

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